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1

[IEEE 2011 IEEE Symposium on Industrial Electronics and Applications (ISIEA 2011) - Langkawi, Malaysia (2011.09.25-2011.09.28)] 2011 IEEE Symposium on Industrial Electronics and Applications - Implementation of the Advanced Encryption Standard on GPUs with the NVIDIA CUDA framework

Maistri, Paolo, Masson, Florian, Leveugle, Regis

Year:

2011

Language:

english

File:

PDF, 392 KB

english, 2011

2

Hardware Support for Security in the Internet of Things: From Lightweight Countermeasures to Accelerated Homomorphic Encryption

Leveugle, Régis, Mkhinini, Asma, Maistri, Paolo

Journal:

Year:

2018

Language:

english

File:

PDF, 2.18 MB

english, 2018

3

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Dynamic Authentication-Based Secure Access to Test Infrastructure

Portolan, Michele, Reynaud, Vincent, Maistri, Paolo, Leveugle, Regis

Year:

2020

File:

PDF, 711 KB

2020

4

[IEEE 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Amsterdam, Netherlands (2018.9.13-2018.9.13)] 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model

Dutertre, Jean-Max, Beroulle, Vincent, Candelier, Philippe, De Castro, Stephan, Faber, Louis-Barthelemy, Flottes, Marie-Lise, Gendrier, Philippe, Hely, David, Leveugle, Regis, Maistri, Paolo, Di Natal

Year:

2018

Language:

english

File:

PDF, 1.18 MB

english, 2018

5

[IEEE 2019 IEEE 4th International Verification and Security Workshop (IVSW) - Rhodes Island, Greece (2019.7.1-2019.7.3)] 2019 IEEE 4th International Verification and Security Workshop (IVSW) - A Comprehensive Approach to a Trusted Test Infrastructure

Merandat, Marc, Reynaud, Vincent, Valea, Emanuele, Quevremont, Jerome, Valette, Nicolas, Maistri, Paolo, Leveugle, Regis, Flottes, Marie-Lise, Dupuis, Sophie, Rouzeyre, Bruno, Di Natale, Giorgio

Year:

2019

File:

PDF, 664 KB

2019

6

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks

Papadimitriou, Athanasios, Hely, David, Beroulle, Vincent, Maistri, Paolo, Leveugle, Regis

Year:

2014

Language:

english

File:

PDF, 483 KB

english, 2014

7

[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Chip level security: Why ? How ?

Leveugle, Regis

Year:

2008

Language:

english

File:

PDF, 358 KB

english, 2008

8

[IEEE 2016 Euromicro Conference on Digital System Design (DSD) - Limassol, Cyprus (2016.8.31-2016.9.2)] 2016 Euromicro Conference on Digital System Design (DSD) - HLS-Based Methodology for Fast Iterative Development Applied to Elliptic Curve Arithmetic

Pontie, Simon, Bourge, Alban, Prost-Boucle, Adrien, Maistri, Paolo, Muller, Olivier, Leveugle, Regis, Rousseau, Frederic

Year:

2016

Language:

english

File:

PDF, 312 KB

english, 2016

9

[IEEE 2019 IEEE European Test Symposium (ETS) - Baden-Baden, Germany (2019.5.27-2019.5.31)] 2019 IEEE European Test Symposium (ETS) - Approximate computing design exploration through data lifetime metrics

Savino, Alessandro, Portolan, Michele, Leveugle, Regis, Di Carlo, Stefano

Year:

2019

Language:

english

File:

PDF, 440 KB

english, 2019

10

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Effective Checkpoint and Rollback Using Hardware/OS Collaboration

Michele, Portolan, Regis, Leveugle

Year:

2007

Language:

english

File:

PDF, 158 KB

english, 2007

11

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Electromagnetic attacks on embedded devices: A model of probe-circuit power coupling

Alberto, Diego, Maistri, Paolo, Leveugle, Regis

Year:

2014

Language:

english

File:

PDF, 570 KB

english, 2014

12

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - Dependability issues in SRAM-based FPGA design

Leveugle, Regis

Year:

2007

Language:

english

File:

PDF, 143 KB

english, 2007

13

[ACM Press the 23rd ACM international conference - Paris, France (2013.05.02-2013.05.03)] Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI - GLSVLSI '13 - An evaluation of an AES implementation protected against EM analysis

Maistri, Paolo, Tiran, Sebastien, Maurine, Philippe, Koren, Israel, Leveugle, Régis

Year:

2013

Language:

english

File:

PDF, 419 KB

english, 2013

14

[IEEE 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Platja d'Aro (2018.7.2-2018.7.4)] 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) - The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks

Dutertre, Jean-Max, Beroulle, Vincent, Candelier, Philippe, Faber, Louis-Barthelemy, Flottes, Marie-Lise, Gendrier, Philippe, Hely, David, Leveugle, Regis, Maistri, Paolo, Natale, Giorgio Di, Papadimi

Year:

2018

Language:

english

File:

PDF, 131 KB

english, 2018

15

[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Reliability of computing systems: From flip flops to variables

Di Natale, Giorgio, Kooli, Maha, Bosio, Alberto, Portolan, Michele, Leveugle, Regis

Year:

2017

Language:

english

File:

PDF, 470 KB

english, 2017

16

Experimental Assessment of Cache Memory Soft Error Rate Prediction Technique

Houssany, Sabrine, Guibbaud, Nicolas, Bougerol, Antonin, Leveugle, Regis, Santini, Thomas, Miller, Florent

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 690 KB

english, 2013

17

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Detailed Analyses of Single Laser Shot Effects in the Configuration of a Virtex-II FPGA

Canivet, Gaetan, Clédière, Jessy, Ferron, Jean Baptiste, Valette, Frederic, Renaudin, Marc, Leveugle, Régis

Year:

2008

Language:

english

File:

PDF, 334 KB

english, 2008

18

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - A Highly Flexible Hardened RTL Processor Core Based on LEON

Portolan, Michele, Leveugle, Regis

Year:

2005

Language:

english

File:

PDF, 1.55 MB

english, 2005

19

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks

Papadimitriou, Athanasios, Hely, David, Beroulle, Vincent, Maistri, Paolo, Leveugle, Regis

Year:

2014

Language:

english

File:

PDF, 483 KB

english, 2014

20

[IEEE 2016 11th International Design & Test Symposium (IDT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 11th International Design & Test Symposium (IDT) - Tutorial 1: “New approaches towards early dependability evaluation of digital integrated systems”

Leveugle, Regis

Year:

2016

Language:

english

File:

PDF, 87 KB

english, 2016

21

[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Complementary Formal Approaches for Dependability Analysis

Baarir, Souheib, Braunstein, Cécile, Clavel, Renaud, Encrenaz, Emmanuelle, Ilié, Jean-Michel, Leveugle, Régis, Mounier, Isabelle, Pierre, Laurence, Poitrenaud, Denis

Year:

2009

Language:

english

File:

PDF, 349 KB

english, 2009

22

[IEEE 2019 IEEE European Test Symposium (ETS) - Baden-Baden, Germany (2019.5.27-2019.5.31)] 2019 IEEE European Test Symposium (ETS) - Alternatives to Fault Injections for Early Safety/Security Evaluations

Portolan, Michele, Savino, Alessandro, Leveugle, Regis, Di Carlo, Stefano, Bosio, Alberto, Di Natale, Giorgio

Year:

2019

Language:

english

File:

PDF, 580 KB

english, 2019

23

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Software Self-Testing of a Symmetric Cipher with Error Detection Capability

Maistri, Paolo, Excoffon, Cyril, Leveugle, Régis

Year:

2008

Language:

english

File:

PDF, 319 KB

english, 2008

24

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Characterization of Effective Laser Spots during Attacks in the Configuration of a Virtex-II FPGA

Canivet, Gaetan, Leveugle, Regis, Clediere, Jessy, Valette, Frederic, Renaudin, Marc

Year:

2009

Language:

english

File:

PDF, 802 KB

english, 2009

25

Dummy operations in scalar multiplication over elliptic curves: A tradeoff between security and performance

Pontie, Simon, Maistri, Paolo, Leveugle, Régis

Journal:

Microprocessors and Microsystems

Year:

2016

Language:

english

File:

PDF, 2.87 MB

english, 2016

26

Forecasting the Effects of Electromagnetic Fault Injections on Embedded Cryptosystems

Alberto, Diego, Maistri, Paolo, Leveugle, Régis

Journal:

Information Security Journal A Global Perspective

Year:

2013

Language:

english

File:

PDF, 333 KB

english, 2013

27

A New Critical Variable Analysis in Processor-Based Systems

Bergaoui, Salma, Vanhauwaert, Pierre, Leveugle, Regis

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 436 KB

english, 2010

28

[IEEE 2015 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) - Washington, DC, USA (2015.5.5-2015.5.7)] 2015 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) - Validation of RTL laser fault injection model with respect to layout information

Papadimitriou, Athanasios, Tampas, Marios, Hely, David, Beroulle, Vincent, Maistri, Paolo, Leveugle, Regis

Year:

2015

Language:

english

File:

PDF, 245 KB

english, 2015

29

Special section on defect and fault tolerance in VLSI systems

Régis Leveugle, Glenn Chapman

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 39 KB

english, 2003

30

Analysis of laser-induced errors: RTL fault models versus layout locality characteristics

Papadimitriou, Athanasios, Hély, David, Beroulle, Vincent, Maistri, Paolo, Leveugle, Regis

Journal:

Microprocessors and Microsystems

Year:

2016

Language:

english

File:

PDF, 1.52 MB

english, 2016

31

[IEEE 2010 First IEEE Latin American Symposium on Circuits and Systems (LASCAS) - Foz do Iguacu, Brazil (2010.2.24-2010.2.26)] 2010 First IEEE Latin American Symposium on Circuits and Systems (LASCAS) - A new automated instrumentation for emulation-based fault injection

Leveugle, Regis, Prost-Boucle, Adrien

Year:

2010

Language:

english

File:

PDF, 378 KB

english, 2010

32

[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - An Elliptic Curve Crypto-Processor Secured by Randomized Windows

Pontie, Simon, Maistri, Paolo, Leveugle, Regis

Year:

2014

Language:

english

File:

PDF, 588 KB

english, 2014

33

[IEEE 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Grenoble, France (2014.6.30-2014.7.3)] 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Fast register criticality evaluation in a SPARC microprocessor

Chibani, Kais, Portolan, Michele, Leveugle, Regis

Year:

2014

Language:

english

File:

PDF, 655 KB

english, 2014

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